Application scenarios
Phased array flaw detectors are widely used in various industries, including industrial manufacturing, aerospace, petroleum and petrochemical, construction engineering, etc.
The multi technology flaw detector combines advanced fully focused phased array technology, intuitive menu functions, and excellent imaging analysis capabilities, and is widely used in corrosion detection, weld seam detection, HTHA defect detection, and other fields.
Innovative and efficient TFM (fully focused approach)
The Acoustic Impact Mapping (AIM) tool can provide real-time visualization models of sensitivity based on your TFM (Fully Focused Mode) mode, probe, settings, and simulated reflectors.
The Acoustic Impact Mapping (AIM) tool eliminates guesswork in the creation process of scanning plans, as a rendering of a certain sound wave group (TFM mode) will be displayed on the screen, allowing you to see the location where sensitivity disappears and make corresponding adjustments to the scanning plan.
Benefiting from 64 chip pulse generator phased array technology
The OmniScan X3 64 flaw detector can fully utilize the potential of 64 chip phased array probes and improve the resolution at the focal point.
Swipe to the right: Images obtained using a 32 channel OmniScan X3 flaw detector and a 64 chip probe (5L64-A32 model). Although this S-scan
is a high-quality image, its resolution reflects the fact that only the middle 32 chips are available for focusing.
Swipe left: The OmniScan X3 64 flaw detector uses an image obtained with a full 64 chip aperture (5L64-A32 probe) to provide better PA resolution
at the focal point, making it easier for you to distinguish defect indications that are clustered or clustered together.
Realize all 128 chip aperture TFM (fully focused mode)
The new generation of electronic devices enables TFM imaging, which provides better focusing ability for smaller defect indications and improves
signal-to-noise ratio (SNR), offering the ability to provide 128 chip aperture and enhancing image clarity.Swipe to the right: This TFM image was
obtained using 64 chips of OmniScan X3 32 channel model and a 128 chip probe.
Swipe left: This allows us to capture this image using all 128 chip apertures of our 3.5 MHz, 128 chip I4 probe. Please note the increased resolution
and reduced background noise in this image.
Realize TFM (Full Focusing Mode) with a speed up to 4 times faster
When using a 64 chip probe, the acquisition speed of TFM (fully focused mode) can be increased up to 4 times. Compared to models with 32 pulse
generators, the OmniScan X3 64 flaw detector benefits from its larger aperture capability, which significantly improves detection efficiency.
Technical Specifications
| Configuration | 16:64PR | 16:128PR | 32:128PR | 64:128PR |
| Applications | Corrosion monitoring, Pipeline integrity, Manual PA/TFM, TOFD, Small piping | Multi-group high- productivity thin weld PA & TOFD, Wind blade manufacturing, Composite | Multi-group high- productivity thick weld PA & TOFD, Aus tenitic/CRA/Disimilar metal weld, TFM | Multi-group high-productivity very thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, High-productivity TFM, High Temperature hydrogen attack (HTHA), Advanced application development |
| Pulsers (PA) | 16 | 16 | 32 | 64 |
| Receivers | 64 | 128 | 128 | 128 |
| TFM Elements | 32 | 32 | 64 | 128 |
| UT Channels (P/R) | 2 | 2 | 2 | 2 |
| Groups | Up to 2 (PA, UT/TOFD, TFM) or 2 PA with 1 TOFD | Up to 8 total TFM: up to 4 | Up to 8 total TFM: up to 4 | Up to 8 total TFM: up to 4 |
| Bandwidth Frequency | 0.5 to 18 MHz | 0.2 MHz to 26.5 MHz | ||
Maximum Pulse Width (PA) | 500 ns | 1000 ns | ||
| Voltage PA | 40 V, 80 V, and 115 V / Unipolar negative | 10 Vpp, 20 Vpp, 40 Vpp, 80 Vpp, 120 Vpp, and 160 Vpp / Bipolar Square Pulse | ||
Internal SSD Storage Capacity | 64 GB | 1 TB | ||
All Other Features and Specifications | Identical | |||
